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Application of PIXE and XRD to the Characterization of Clays

✍ Scribed by V. Rodriguezlugo; J. Miranda; S. Viquez; V.M. Castano

Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
304 KB
Volume
52
Category
Article
ISSN
0026-265X

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✦ Synopsis

The use of particle induced X-ray emission (PIXE) and X-ray diffraction as complementary techniques for the characterization of mineral samples (clays) is presented. The fundamentals of PIXE experiments, the method for performing quantitative analysis, and the actual results are also discussed. 1905 Academic Press. Inc.

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