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Application of pixe to the measurement of sputter deposits

✍ Scribed by W. Krüger; A. Scharmann; H. Afridi; G. Bräuer

Publisher: Elsevier Science
Year: 1980
Weight: 230 KB
Volume: 168
Category: Article
ISSN: 0029-554X
DOI: 10.1016/0029-554x(80)91285-9

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