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Applications of multi-valued logic to testing of binary andMVL circuits: M Serra (Dept. of Comput. Sci., Victoria Univ.,BC, Canada) Int. J. Electron. (GB), vol. 63, no. 2, pp. 197–214 (Aug. 1987)

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 69 KB
Volume: 19
Category: Article
ISSN: 0026-2692
DOI: 10.1016/s0026-2692(88)80086-7

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New logical-sum and logical-product circ

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📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 98 KB