𝔖 Bobbio Scriptorium
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Application of Transmission Electron Microscopy to Engineering Practice in Ceramics

✍ Scribed by A. H. Heuer; N. J. Tighe

Book ID
110814656
Publisher
John Wiley and Sons
Year
1979
Tongue
English
Weight
44 KB
Volume
62
Category
Article
ISSN
0002-7820

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The resolution of electron energy loss spectroscopy (EELS) is limited by delocalization of inelastic electron scattering rather than probe size in an aberration corrected scanning transmission electron microscope (STEM). In this study, we present an experimental quantification of EELS spatial resolu