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Application of the high-pressure thermoelectric technique for characterization of semiconductor microsamples: PbX-based compounds

✍ Scribed by Ovsyannikov, Sergey V; Shchennikov, Vladimir V; Ponosov, Yuri S; Gudina, Svetlana V; Guk, Vera G; Skipetrov, Eugenii P; Mogilenskikh, Viktor E

Book ID: 120317117
Publisher: Institute of Physics
Year: 2004
Tongue: English
Weight: 175 KB
Volume: 37
Category: Article
ISSN: 0022-3727
DOI: 10.1088/0022-3727/37/8/002

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