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Application of the dynamic SIMS technique to the study of silicone release coatings

✍ Scribed by Judith Stein; Tracey M. Leonard; Gary A. Smith


Publisher
John Wiley and Sons
Year
1991
Tongue
English
Weight
914 KB
Volume
42
Category
Article
ISSN
0021-8995

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✦ Synopsis


SY NOPSlS


πŸ“œ SIMILAR VOLUMES


An HSF-SIMS Investigation of the Prephos
✍ H. Allali; M. Ben Embarek; O. DebrΓ©; B. Nsouli; A. Oladipo; A. Roche; J.-P. Thom πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 204 KB πŸ‘ 1 views

Secondary ion mass spectrometry based on High energy (MeV) Ar 3 + ions and Fast extraction (time-of-flight or TOF) has been used for investigating the prephosphatation contribution to the phosphatation process of silicon steel sample surface. The so-called HSF-SIMS technique allows easy identificati