Application of real-time spectroscopic ellipsometry for characterizing the structure and optical properties of microcrystalline component layers of amorphous semiconductor solar cells

✍ Scribed by Joohyun Koh; H. Fujiwara; C.R. Wronski; R.W. Collins

• Book ID: 108472604
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 372 KB
• Volume: 49
• Category: Article
• ISSN: 0927-0248
• DOI: 10.1016/s0927-0248(97)00187-6