Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $mu$m CMOS SRAM

✍ Scribed by Warren, Kevin M.; Weller, Robert A.; Sierawski, Brian D.; Reed, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Porter, Mark E.; Wilkinson, Jeffrey D.; LaBel, Kenneth A.

• Book ID: 115523591
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 436 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2006.889810