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A transistor performance figure-of-merit including the effect of gate resistance and its application to scaling to sub-0.25-μm CMOS logic technologies

✍ Scribed by Chatterjee, A.; Rodder, M.; Ih-Chin Chen


Book ID
114537291
Publisher
IEEE
Year
1998
Tongue
English
Weight
178 KB
Volume
45
Category
Article
ISSN
0018-9383

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