✦ LIBER ✦

Application of particle-induced X-ray emission, backscattering spectrometry and scanning electron microscopy in the evaluation of orthodontic materials

✍ Scribed by D. Gihwala, J. A. Mars…

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

SCANNING ELECTRON MICROSCOPY-ENERGY DISP

✍ P. KUISMA-KURSULA; J. RÄISÄNEN 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 553 KB

Ion induced X-ray emission and electron

✍ C.M. Romo-Kröger 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 494 KB

Characterization of Precipitates in Ti-S

✍ Geyer, Jutta ;Flock, Jörg ;Broekaert, Jośe A. C. 📂 Article 📅 1999 🏛 Springer-Verlag ⚖ 258 KB

Some applications of proton-induced X-ra

✍ I. Roelandts; G. Robaye; G. Weber; J. M. Delbrouck 📂 Article 📅 1985 🏛 Springer 🌐 English ⚖ 418 KB

Application of High-Angle Annular Dark F

✍ Utsunomiya, Satoshi; Ewing, Rodney C. 📂 Article 📅 2003 🏛 American Chemical Society 🌐 English ⚖ 492 KB

Particle-induced X-ray emission and scan

✍ M González; J.A Banderas; V Rodrı́guez; V.M Castaño 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 336 KB