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Application of high-resolution x-ray diffraction for detecting defects in SiGe(C) materials

✍ Scribed by Radamson, Henry H; Hållstedt, Julius

Book ID: 121460599
Publisher: Institute of Physics
Year: 2005
Tongue: English
Weight: 563 KB
Volume: 17
Category: Article
ISSN: 0953-8984
DOI: 10.1088/0953-8984/17/22/020

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