Application of Exponential Tail-State Distribution Model to the Above-Threshold Characteristics of Zn-Based Oxide Thin-Film Transistors

✍ Scribed by Takechi, K.; Nakata, M.; Eguchi, T.; Yamaguchi, H.; Kaneko, S.

• Book ID: 114619717
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 184 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2026392