𝔖 Bobbio Scriptorium

✦ LIBER ✦

Application of electron holography to extended defects: Schottky barriers at NiSi2 precipitates in silicon

✍ Scribed by P. Formanek; M. Kittler

Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 392 KB
Volume: 2
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200460545

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

On the characterization of electrically

On the characterization of electrically active inhomogeneities in semiconductor silicon by charge collection at schottky barriers using the SEM-EBIC (II). Contrast due to defects

✍ M. Kittler 📂 Article 📅 1980 🏛 John Wiley and Sons 🌐 English ⚖ 696 KB