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Application of combined experimental and numerical techniques in determining the temperature dependence of reflectivity of semiconductors

✍ Scribed by R. Černý; V. Cháb; P. Přikryl


Book ID
105200426
Publisher
Springer
Year
1996
Tongue
English
Weight
321 KB
Volume
17
Category
Article
ISSN
0195-928X

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A new technique for the determination of reflection coefficients arising in dispersive systems is presented. The method makes use of cepstral analysis, which relies on a single measured signal. In earlier studies cepstral methods have been applied to reflection coefficient determination for non-disp