β Scribed by Takeshi Nakatani; Tomohiro Matsushita; Yutaka Miyatake; Tomohito Nohno; Atsushi Kobayashi; Keiki Fukumoto; Shunsuke Okamoto; Azusa Nakamoto; Fumihiko Matsui; Ken Hattori; Masato Kotsugi; Yuji Saitoh; Shigemasa Suga; Hiroshi Daimon
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The application of atomic force microscopy (AFM) to probe the ultrastructure and physical properties of microbial cell surfaces is reviewed. The unique capabilities of AFM can be summarized as follows: imaging surface topography with (sub)nanometer lateral resolution; examining biological specimens
A direct inversion method is used to transform measured intensities of He diffraction from MgO(1~) over a wide energy range into the part of the interaction potential that depends on surface structure. This provides the first inversion of atom/surface scattering data. Intensities computed from the i