Application of atomic force microscopy to microbial surfaces: from reconstituted cell surface layers to living cells

✍ Scribed by Y.F Dufrêne

• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 824 KB
• Volume: 32
• Category: Article
• ISSN: 0968-4328
• DOI: 10.1016/s0968-4328(99)00106-7

✦ Synopsis

The application of atomic force microscopy (AFM) to probe the ultrastructure and physical properties of microbial cell surfaces is reviewed. The unique capabilities of AFM can be summarized as follows: imaging surface topography with (sub)nanometer lateral resolution; examining biological specimens under physiological conditions; measuring local properties and interaction forces. AFM is being used increasingly for: (i) visualizing the surface ultrastructure of microbial cell surface layers, including bacterial S-layers, purple membranes, porin OmpF crystals and fungal rodlet layers; (ii) monitoring conformational changes of individual membrane proteins; (iii) examining the morphology of bacterial biofilms, (iv) revealing the nanoscale structure of living microbial cells, including fungi, yeasts and bacteria, (v) mapping interaction forces at microbial surfaces, such as van der Waals and electrostatic forces, solvation forces, and steric/bridging forces; and (vi) probing the local mechanical properties of cell surface layers and of single cells.