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Application of an iterative maximum-likelihood algorithm in PIXE depth profiling of trace elements

✍ Scribed by S.C. Liew; K.K. Loh; S.M. Tang

Book ID: 113285892
Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 515 KB
Volume: 85
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(94)95894-7

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