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Application of a strip-yield model to predict crack growth under variable-amplitude and spectrum loading – Part 1: Compact specimens

✍ Scribed by Y. Yamada; B. Ziegler; J.C. Newman Jr.

Book ID: 113601837
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 902 KB
Volume: 78
Category: Article
ISSN: 0013-7944
DOI: 10.1016/j.engfracmech.2011.06.015

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## Abstract Fatigue‐crack‐growth tests were conducted on compact, C(T), specimens made of D16Cz aluminum alloy. Constant‐amplitude tests were conducted over a range of stress ratios (R = P~min~/P~max~ = 0.1 to 0.75). Comparisons were made between test data from middle‐crack tension, M(T), specimens