Crack growth predictions using a strip-yield model for variable-amplitude and spectrum loading
✍ Scribed by B. Ziegler; Y. Yamada; J. C. Newman Jr.
- Publisher
- John Wiley and Sons
- Year
- 2008
- Tongue
- English
- Weight
- 334 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0933-5137
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✦ Synopsis
Abstract
Fatigue‐crack‐growth tests were conducted on compact, C(T), specimens made of D16Cz aluminum alloy. Constant‐amplitude tests were conducted over a range of stress ratios (R = P~min~/P~max~ = 0.1 to 0.75). Comparisons were made between test data from middle‐crack tension, M(T), specimens from the literature and C(T) specimens. A crack‐closure analysis was used to collapse the rate data from both specimen types into a fairly narrow band over many orders of magnitude in rates using proper constraint factors. Constraint factors were established from single‐spike overload and constant‐amplitude tests. The life‐prediction code, FASTRAN, which is based on the strip‐yield‐model concept, was used to calculate the crack‐length‐against‐cycles under constant‐amplitude (CA) loading and the single‐spike overload (OL) tests; and to predict crack growth under variable‐amplitude (VA) loading on M(T) specimens and simulated aircraft loading spectrum tests on both specimen types. The calculated crack‐growth lives under CA and the OL tests were generally within ±20 % of the test results, the predicted crack‐growth lives for the VA and Mini‐Falstaff tests on the M(T) specimens were short by 30 to 45 %, while the Mini‐Falstaff+ results on the C(T) specimens were within 10 %. Issues on the crack‐starter notch effects under spectrum loading are discussed, and recommendations are suggested on avoiding these notch effects.