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Anomalous X-ray scattering studies on semiconducting and metallic glasses

✍ Scribed by S. Hosokawa, W. -C. Pilgrim, J. -F. Bérar, S. Kohara

Book ID
114995315
Publisher
Springer-Verlag
Year
2012
Tongue
English
Weight
804 KB
Volume
208
Category
Article
ISSN
1951-6355

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## Abstract Anomalous X‐ray scattering experiments on glassy Ge~__x__~Se~1−__x__~ semiconductors have been carried out at energies close to the Ge and Se K edges in a wide concentration range from __x__ = 0.15 to 0.333 across the rigidity percolation threshold composition of __x__ = 0.20. The total