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Rigidity transitions and intermediate structures of Ge–Se glasses – An anomalous X-ray scattering study

✍ Scribed by S. Hosokawa; Y. Wang; M. Sakurai; J.-F. Bérar; W.-C. Pilgrim; K. Murase


Book ID
114166197
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
137 KB
Volume
199
Category
Article
ISSN
0168-583X

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Anomalous X-ray scattering study of the
✍ Hosokawa, S. ;Oh, I. ;Sakurai, M. ;Pilgrim, W.-C. ;Boudet, N. ;Bérar, J.-F. 📂 Article 📅 2009 🏛 John Wiley and Sons 🌐 English ⚖ 1023 KB

## Abstract Anomalous X‐ray scattering experiments on glassy Ge~__x__~Se~1−__x__~ semiconductors have been carried out at energies close to the Ge and Se K edges in a wide concentration range from __x__ = 0.15 to 0.333 across the rigidity percolation threshold composition of __x__ = 0.20. The total