Anomalous X-ray scattering study of the
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Hosokawa, S. ;Oh, I. ;Sakurai, M. ;Pilgrim, W.-C. ;Boudet, N. ;Bérar, J.-F.
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Article
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2009
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John Wiley and Sons
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English
⚖ 1023 KB
## Abstract Anomalous X‐ray scattering experiments on glassy Ge~__x__~Se~1−__x__~ semiconductors have been carried out at energies close to the Ge and Se K edges in a wide concentration range from __x__ = 0.15 to 0.333 across the rigidity percolation threshold composition of __x__ = 0.20. The total