Anomalous Hot-Carrier-Induced Linear Drain Current Degradation of LDMOS Under Pulse Gate Stress With Different Amplitudes

✍ Scribed by Liu, Siyang; Sun, Weifeng; Wan, Weijun; Su, Wei; Wang, Shaorong; Ma, Shulang

• Book ID: 121246043
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 659 KB
• Volume: 34
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2013.2256103