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Annihilation of edge dislocation dipoles by a glide mechanism

✍ Scribed by H. Strunk; H. Strecker


Publisher
Elsevier Science
Year
1984
Weight
808 KB
Volume
62
Category
Article
ISSN
0025-5416

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## Abstract The EBIC data obtained from individual edge and Frank partial dislocations ^i^n Si, and described in other publications, are related to defect parameters, such as the capture cross‐section for minority carriers, which determine electrical recombination properties of dislocations. A two