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Anisotropic oxidation of MoS2 crystallites studied by angle-resolved X-ray photoelectron spectroscopy

✍ Scribed by Jeffrey R. Lince; Peter P. Frantz

Book ID
110378356
Publisher
Springer US
Year
2001
Tongue
English
Weight
660 KB
Volume
9
Category
Article
ISSN
1023-8883

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## Abstract Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) has been used to study the composition of oxides grown on γ€ˆ110〉 and γ€ˆ100〉 GaAs during exposure to UV/ozone. The effects of substrate treatments on oxide growth were compared on γ€ˆ100〉 surfaces exposed to an HF treatment and thermal