Angular dependent soft x-ray absorption spectroscopy of vanadium oxides
✍ Scribed by E. Goering; O. Mu¨ller; M.L. denBoer; S. Horn
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 169 KB
- Volume
- 194-196
- Category
- Article
- ISSN
- 0921-4526
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We measured the O 1s and Ti 2p X-Ray Absorption Spectroscopy (XAS) spectra of a series of ternary Ti oxides. The spectra of are compared to those of and the physical mixture The spectra reÑect A1 2 TiO 5 TiO 2 TiO 2 -Al 2 O 3 . important di †erences in the electronic structure caused by changes in t
## Silicon with thermally-grown oxide overlayers m the thickness range IS-89 A IS studied by angulardcpendent XPS. Electron attenuation lengths at 1382 eV are found to be 37 +-4 A in SiOz and 27 +-6 A in Si. Single-crystal effects and thin-layer anomalies are also discussed.