𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Angular correlation studies of thin metal films

✍ Scribed by L. G. Aravin; K. A. Valiev; V. I. Goldanskii; Yu. A. Novikov; A. V. Rakov; M. K. Filimonov; V. P. Shantarovich

Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
259 KB
Volume
23
Category
Article
ISSN
0232-1300

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

Thin Films of Macroporous Metal Oxides
Thin Films of Macroporous Metal Oxides
✍ M. E. Turner; T. J. Trentler; V. L. Colvin πŸ“‚ Article πŸ“… 2001 πŸ› John Wiley and Sons 🌐 English βš– 389 KB πŸ‘ 2 views
Raman Studies of Molecular Thin Films
Raman Studies of Molecular Thin Films
✍ Zahn, D.R.T. πŸ“‚ Article πŸ“… 2001 πŸ› John Wiley and Sons 🌐 English βš– 175 KB πŸ‘ 2 views
Numerical studies of the detection of ta
Numerical studies of the detection of targets embedded in clutter by using angular correlation function and angular correlation imaging
✍ Guifu Zhang; Leung Tsang; Yasuo Kuga πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 198 KB πŸ‘ 1 views

We study a detection method for targets embedded in a clutter en¨ironment based on the 3-D angular correlation function ( ) ACF . The clutter is modeled by randomly distributed small scatterers. The total scattered wa¨e field at the recei¨er is calculated using Monte Carlo simulations, and is used f

Spectroscopic ellipsometry measurements
Spectroscopic ellipsometry measurements of thin metal films
✍ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 151 KB πŸ‘ 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal