Angular corrections for determining the electron inelastic mean free path (IMFP) by elastic peak electron spectroscopy
β Scribed by G. Gergely
- Publisher
- Elsevier Science
- Year
- 1987
- Tongue
- English
- Weight
- 225 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0042-207X
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π SIMILAR VOLUMES
Theoretical values of the inelastic mean free path (IMFP) and their electron-energy dependence are available in the literature from predictive formulae for various categories of materials, such as elemental solids, inorganic and organic compounds. in contrast, the experimental IMFP values were deter
Intensity ratios of electrons backscattered elastically from thick, amorphous Si, polycrystalline Ag and Au, as well as various (vacuum evaporated, electrodeposited layers and metallic sheets) polycrystalline Ni samples, were measured using high energy resolution and two different experimental geome
Elastic peak depth proΓling was carried out on an Mo/Si multilayer system using a rotating specimen, grazing angle of incidence (86Γ with respect to the surface normal) and 0.5 keV Ar ion energy. The depth proΓling was simulated by dynamic TRIM (T-DYN) code. The T-DYN code provided the in-depth dist