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Angle determination for side views in single particle electron microscopy

✍ Scribed by Lindsay A. Baker; John L. Rubinstein


Book ID
116696873
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
999 KB
Volume
162
Category
Article
ISSN
1047-8477

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## Abstract The specimen holder for scanning electron microscopy described herein allows a single specimen to be examined in any possible view and significantly improves object illumination. The specimen is glued to a fine pin and flexibly mounted on a double‐sided adhesive conductive pad on a rota