A scanning electron microscopy specimen
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Hans Pohl
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Article
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2010
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John Wiley and Sons
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English
β 433 KB
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## Abstract The specimen holder for scanning electron microscopy described herein allows a single specimen to be examined in any possible view and significantly improves object illumination. The specimen is glued to a fine pin and flexibly mounted on a doubleβsided adhesive conductive pad on a rota