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A scanning electron microscopy specimen holder for viewing different angles of a single specimen

✍ Scribed by Hans Pohl

Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
433 KB
Volume
73
Category
Article
ISSN
1059-910X

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✦ Synopsis

Abstract

The specimen holder for scanning electron microscopy described herein allows a single specimen to be examined in any possible view and significantly improves object illumination. The specimen is glued to a fine pin and flexibly mounted on a double‐sided adhesive conductive pad on a rotatable pivot. A milled pot placed beneath the specimen acts as an electron trap. This provides a homogeneous black image background by minimizing noisy signals from the specimen's surroundings. Microsc. Res. Tech. 73:1073–1076, 2010. Β© 2010 Wiley‐Liss, Inc.

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