ANFIS-based approach to studying subthreshold behavior including the traps effect for nanoscale thin-film DG MOSFETs

✍ Scribed by Bentrcia, T.; Djeffal, F.; Chebaaki, E.

• Book ID: 127180509
• Publisher: IOP Publishing
• Year: 2013
• Tongue: English
• Weight: 986 KB
• Volume: 34
• Category: Article
• ISSN: 1674-4926
• DOI: 10.1088/1674-4926/34/8/084001