Analytical modeling of the substrate effect on accumulation-mode SOI pMOSFETs at room temperature and at 77 K
✍ Scribed by Marcelo Antonio Pavanello; João Antonio Martino; Jean-Pierre Colinge
- Book ID
- 104306456
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 233 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0167-9317
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✦ Synopsis
In this work a theoretical and experimental analysis of the substrate effect on fully depleted accumulation-mode silicon-on-insulator (SOI) pMOSFETs at room and at liquid nitrogen temperatures is presented. The theoretical results are compared with MEDICI numerical bidimensional simulations in order to validate the proposed model. The substrate influence on the SOI pMOSFET front threshold voltage is given. Finally, a comparison between modeled and experimental data is realized.
📜 SIMILAR VOLUMES
In this paper, the effective densities of states for the conduction and valence bands, Nc and N,, the intrinsic carrier concentration ni and the ionized doping concentration in strained Si,\_,Ge, layers grown on (001) Si substrates are analytically calculated, and their temperature and Ge fraction d