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Analytical modeling of oxide breakup effect on base current in n +-polysilicon emitter bipolar devices

✍ Scribed by Sung, J.J.; Liu, T.M.; Kim, Y.O.; Chiu, T.-Y.

Book ID
114534952
Publisher
IEEE
Year
1992
Tongue
English
Weight
594 KB
Volume
39
Category
Article
ISSN
0018-9383

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