Analytical model for electrical and thermal transients of self-heating semiconductor devices

✍ Scribed by Yu Zhu, ; Twynam, J.K.; Yagura, M.; Hasegawa, M.; Hasegawa, T.; Eguchi, Y.; Yamada, A.; Suematsu, E.; Sakuno, K.; Sato, H.; Hashizume, N.

• Book ID: 125425879
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 226 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/22.739207