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Analytical Investigation of the Influence of the Structural Parameters of the Optoelectronic Path of a Thermal-Imaging Device on Its Characteristics

โœ Scribed by V. N. Krutikov

Book ID
110440152
Publisher
Springer US
Year
2003
Tongue
English
Weight
129 KB
Volume
46
Category
Article
ISSN
0543-1972

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The clathrates of Ni-and Co-Werner complexes with 0-, m-, and p-xylenes were studied in order to explain the controlling factors affecting clathration. The complexes and their clathrates have been investigated using an analytical X-ray powder diffraction procedure for the structure determination. It