Analytical Approximations for the Distributions of Intrinsic Point Defects in Grown Silicon Crystals

✍ Scribed by Lemke, H. ;Südkamp, W.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 333 KB
• Volume: 176
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199912)176:2<843::aid-pssa843>3.0.co;2-8