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Analysis of two stage sampling plan with imperfect inspection

✍ Scribed by Nasser S. Fard; Jason J. Kim

Book ID: 107965751
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 283 KB
Volume: 25
Category: Article
ISSN: 0360-8352
DOI: 10.1016/0360-8352(93)90318-r

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