Analysis of two stage sampling plain with imperfect inspection : Nasser S. Fard and Jason J. Kim. Computers and Industrial Engineering, 25(1), 453 (1993)

• Book ID: 103283126
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 109 KB
• Volume: 34
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(94)90351-4