Analysis of thickness modulation in GaAs/GaAsP strained superlattice by TEM observation

✍ Scribed by Xiuguang Jin; Hirotaka Nakahara; Koh Saitoh; Takashi Saka; Toru Ujihara; Nobuo Tanaka; Yoshikazu Takeda

• Book ID: 116630333
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 691 KB
• Volume: 353
• Category: Article
• ISSN: 0022-0248
• DOI: 10.1016/j.jcrysgro.2012.05.017