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Observation of dark line defects in InGaAs/GaAs strained layer superlattices by photoluminescence topography

✍ Scribed by Kanji Iizuka; Takashi Yoshida; Toshimasa Suzuki; Haruo Hirose


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
345 KB
Volume
111
Category
Article
ISSN
0022-0248

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