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Analysis of the dielectric characteristics for polycrystalline Ba0.65Sr0.35TiO3(I)–frequency dependence in the paraelectric state

✍ Scribed by Jih-Wei Liou; Bi-Shiou Chiou


Book ID
110270750
Publisher
Springer US
Year
2000
Tongue
English
Weight
261 KB
Volume
11
Category
Article
ISSN
0957-4522

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New SEM-Auger microanalyzer with U HV capability. (USA) The design and performance of a new Auger microanalyzer (EMAS) with the capability of UHV scanning electron microscope (SEM) is described. The incident electron beam is focused by a magnetic lens system, and the spatial resolution is below 0.5