Field-effect analysis for the determination of gap-state density and Fermi-level temperature dependence in polycrystalline silicon

✍ Scribed by Fortunato, G.; Meakin, D. B.; Migliorato, P.; Combers, P. G. Le

• Book ID: 111877655
• Publisher: Taylor and Francis Group
• Year: 1988
• Tongue: English
• Weight: 592 KB
• Volume: 57
• Category: Article
• ISSN: 1364-2812
• DOI: 10.1080/13642818808211229