Analysis of the deep depletion MOSFET and the use of the d.c. characteristics for determining bulk-channel chargecoupled device parameters : Roger A. Haken. Solid-St. Electron. 21, 753 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 133 KB
• Volume: 18
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90289-5