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Analysis of the deep depletion MOSFET and the use of the d.c. characteristics for determining bulk-channel chargecoupled device parameters : Roger A. Haken. Solid-St. Electron. 21, 753 (1978)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
133 KB
Volume
18
Category
Article
ISSN
0026-2714

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