Analysis of the Broadening of X-ray Photoelectron Spectroscopy Peaks for Ionic Crystals
✍ Scribed by Dr. Connie J. Nelin; Prof. Dr. Paul S. Bagus; Dr. Matthew A. Brown; Dr. Martin Sterrer; Prof. Dr. Hans-Joachim Freund
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 683 KB
- Volume
- 123
- Category
- Article
- ISSN
- 0044-8249
No coin nor oath required. For personal study only.
📜 SIMILAR VOLUMES
A method to prevent the reduction of CuO formed on Cu metal during x-ray photoelectron spectroscopy analysis is presented. When a bias voltage of -250 V was applied to the sample surface in the case of non-monochromatic Mg Ka,, irradiation, the reduction of CuO to the lower oxide (Cuz+ \* Cu+) was s
Ah&act-Various applications of X-ray photoelectron spectroscopy (XPS) for carbon fiber are described. Car~ni~tion process on surface of fiber is tracked by XPS as variation of elemen~i composi~n and also of chemical species revealed by chemical shift in XPS spectra as shown in Pig. 2. Surface oxida
X-ray photoelectron spectroscopy (XPS) has been used to determine the species present in urban particulate matter collected in the city of Cagliari (Sardinia, Italy) and in an industrial area near to Cagliari. Samples were collected on both cellulose and glass fiber filters. Elemental identification