Analysis of the basic statistical properties of randomly rough curved surfaces by shearing interferometry
β Scribed by Ohlidal, Ivan ;Navratil, Karel
- Book ID
- 115333794
- Publisher
- The Optical Society
- Year
- 1985
- Tongue
- English
- Weight
- 847 KB
- Volume
- 24
- Category
- Article
- ISSN
- 1559-128X
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
Much of the practical interest attached to curves and surfaces derives from features of roughness, rather than smoothness. For example, considerable attention has been paid to fractal models of curves and surfaces, for which the notions of a normal and curvature are usually not well defined. Neverth
Approaches are described for the analysis of XPS signals from samples comprising thin conformal coatings on substrates with non-ideal surface topography. In particular, attention is focused on arbitrarily shaped rough or curved substrates. Relations are derived for the relative x-ray photoelectron i