✦ LIBER ✦

Analysis of surface particles by time-of-flight secondary ion mass spectrometry

✍ Scribed by P.K. Chu; R.W. Odom; D.F. Reich

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Surface analysis of dielectric films by

✍ M Leisch 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 330 KB

Secondary ion mass spectrometry by time-

✍ K.G. Standing; R. Beavis; W. Ens; B. Schueler 📂 Article 📅 1983 🏛 Elsevier Science ⚖ 513 KB

Polymer Surfaces and Interfaces || Time-

✍ Stamm, Manfred 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 479 KB

Analysis of ionic metal complexes by tim

✍ Herbert Feld; Angelika Leute; Derk Rading; Alfred Benninghoven; Gerhard Reusmann 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 622 KB

Quantitative surface analysis of steel f

✍ Van Craen, M.; Natusch, D. F. S.; Adams, F. 📂 Article 📅 1982 🏛 American Chemical Society 🌐 English ⚖ 691 KB

Measurement of Insulator Surface Potenti

✍ X. Q. Guo; R. T. Short 📂 Article 📅 1996 🏛 John Wiley and Sons 🌐 English ⚖ 533 KB