✦ LIBER ✦

Analysis of semiconductors by ion channelling: Applications and pitfalls

✍ Scribed by J.S. Williams; M. Conway; J.A. Davies; M. Petravic; H.H. Tan; J. Wong-Leung

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Ultrashallow profiling of semiconductors

✍ E. Napolitani; A. Carnera; V. Privitera; F. Priolo 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 165 KB

Implantation and channeling effects of a

✍ D.B. Medved; J. Perel; H.L. Daley; G.P. Rolik 📂 Article 📅 1965 🏛 Elsevier Science ⚖ 263 KB

Assessment of subsurface damage in polis

✍ D.A. Lucca; C.J. Wetteland; A. Misra; M.J. Klopfstein; M. Nastasi; C.J. Maggiore 📂 Article 📅 2004 🏛 Elsevier Science 🌐 English ⚖ 426 KB

Modification of diamond films by high-en

✍ S.A Fedotov; A.V Byeli; A.M Zaitsev; V.S Varichenko; N.M Kazyutchits 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 106 KB

Analysis of defects in multicomponent cr

✍ A Stonert; A Turos; L Nowicki; B Breeger 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 172 KB

Semiconductor applications of thin films

✍ James R. Sites 📂 Article 📅 1977 🏛 Elsevier Science 🌐 English ⚖ 334 KB