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Analysis of r.f.-sputtered TiB2 hard coatings by means of X-ray diffractometry and Auger electron spectroscopy

✍ Scribed by R. Lohmann; E. Österschulze; K. Thoma; H. Gärtner; W. Herr; B. Matthes; E. Broszeit; K.-H. Kloos

No coin nor oath required. For personal study only.

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