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Analysis of organic multilayers and 3D structures using Ar cluster ions

✍ Scribed by E. Niehuis; R. Möllers; D. Rading; H.-G. Cramer; R. Kersting


Book ID
112206900
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
224 KB
Volume
45
Category
Article
ISSN
0142-2421

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## Abstract Rutherford backscattering (RBS) and particle‐induced X‐ray emission (PIXE) experiments were performed on (Ga,Mn)N epilayers and self‐organized dots grown by plasma‐assisted MBE. The combined channeling RBS and Mn PIXE experiments were performed on Ga~0.949~Mn~0.051~N epilayer, which was