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Analysis of Optically Controlled Microwave/Millimeter-Wave Device Structures

✍ Scribed by Simons, R.N.; Bhasin, K.B.


Book ID
114659190
Publisher
IEEE
Year
1986
Tongue
English
Weight
699 KB
Volume
34
Category
Article
ISSN
0018-9480

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SiC IMPATT de¨ices ha¨e an efficiency and power ad¨antage o¨er Si and GaAs IMPATT de¨ices at millimeter-wa¨e frequencies. A lucky drift model describing ionization rates as a function of electric fields at high temperatures has been incorporated into a Read-type ( large-signal model. The simulation