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Analysis of noise characteristics for the active pixels in CMOS image sensors for X-ray imaging

โœ Scribed by Young Soo Kim; Gyuseong Cho; Jun-Hyung Bae

Book ID
108219695
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
417 KB
Volume
565
Category
Article
ISSN
0168-9002

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